by National Aeronautics and Space Administration, Langley Research Center, National Technical Information Service, distributor in Hampton, Va, [Springfield, Va .
Written in English
|Statement||Robin L. Cravey ... [et al.].|
|Series||NASA technical memorandum -- 110147.|
|Contributions||Cravey, Robin Lee, 1959-, Langley Research Center.|
|The Physical Object|
The capability to measure the dielectric properties of various materials has been developed in the Electromagnetic Properties Measurement Laboratory (EPML) of the Electromagnetics Research Branch (ERB). Two measurement techniques which have been implemented in the EPML to characterize materials are the dielectric probe and waveguide by: Lab Setup and Measurements There are a host of methods for measuring the dielectric permittivity of a material. Here, we will describe two basic experiments. These experiments assume that 1) the sample is non-magnetic (i.e. \(\mu = \mu_0\)) and 2) the conductivity of the sample is sufficiently small (\(\sigma . Measurements of the dielectric properties of frozen cod have been carried out in the temperature range 0 to —30°C. Dielectric loss tangent measurements reflect the different loss mechanisms occurring in a material place in an electric field. Because of all these factors, both measurement techniques and accuracies for evaluation of dielectric properties are requisite for physical : Richard G. Geyer, Jerzy Krupka.
Abstract: Dielectric properties of rocks are the important indicators of subsurface formations when electromagnetic sensing methods are applied. Interpreting those in situ measurements relies on characterizing the dielectric permittivity of rock samples in the laboratory. For solid phase samples, the parallel-plate capacitance method (PCM) serves as one of the most accurate and feasible Cited by: 1. complex dielectric measurements and gives no practical solutions for these measurements. 2 Measurement Methods Measurement of dielectric properties involves measurements of the complex relative permittivity (:r) and complex relative permeability (dielectric permittivity consists of a real part and an imaginary Size: KB. To measure the dielectric properties, the material must be placed between the plates of a condenser and the impedance measured. For measurements on material in the form of film, a simple parallel plate condenser, with the plates fitting closely to the film, can be used. Fibres are less easy to handle. This chapter is mainly concerned with the characterisation of dielectric materials at RF and MW frequencies. There are a number of existing publications that deal with this topic in depth that are well worth consulting. The most recent is the Good Practice Guide from NPL (on which this chapter is based), which deals with the topic by: 4.
dielectric properties. Agilent Technologies Inc. offers a variety of instruments, fixtures, and software to measure the dielectric properties of materials. Agilent measure-ment instruments, such as network analyzers, LCR meters, and impedance analyzers range in frequency up to GHz. Fixtures to hold the material under test (MUT) are File Size: KB. This paper reviews measurement techniques and sources of data for the dielectric constant and loss factor of solid materials. Accurate values of such properties are basic to intelligent design of materials processing schemes utilizing electromagnetic by: 5. Dielectric properties. Dielectric properties are directly related to piezoelectric properties. The dielectric constant, which is the ratio of the permittivity of the material to its permittivity to free space, is an indicator of how the material concentrates on electric flux. Measurement of dielectric properties involves measurements of the complex relative permittivity (e), which consists of a real part and an imaginary part. As mentioned earlier, the real part of the complex permittivity, also known as the dielectric constant is a measure of the amount of energy from an external electrical field stored in the.